Research Interests

Mechanisms of Image Creation in the Non-Contact AFM:Traditional “non-contact” AFM means that the image contrast comes from the region far from contact  between the AFM tip and sample. However, in the non-contact distances, the forces left are rather long-distance. It is easy to see that those forces are not able to produce the atomic resolution that have been  reported in the literature. We suggested that the contrast still comes from the gradient of short-range (contact) forces despite the total force of interaction between the tip and sample looks like the non-contact  one, i.e., attraction. (Theoretical study.) Preprints are available on request.

True atomic resolution in the contact mode AFM:Study of the AFM scanning on atomic level. Purpose is to find conditions of scanning  with so-called true atomic resolution in contact mode. Despite its applied nature, this basic research brings us understanding of interactions between nano-particles. (Experimental and theoretical study.) Preprints are available on request. Click here for more info.

Friction on molecular level: Focusing on study of van der Waals trap, which appears when a sharp apex scans over the surface in the vicinity of nano-scale defects. Study of (1) conditions of appearance of the trap, (2) values of macroscopic manifestation of this effect, (3) how to avoid the trapping. (Experimental and computational study.) Click here for more info.

Molecular Interactions between Submicron Particles and Surfaces Used in Chemical-Mechanical Planarization (CMP): Study of intermolecular/atomic forces that act between submicron particles of slurry, particular silica, and various materials used in CMP.

 

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